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Features: EX-LIBRARY
Book Title: High Resolution X-Ray Diffractometry and Topography Hardcover
Number of Pages: 264 Pages
Publication Name: High Resolution X-Ray Diffractometry and Topography
Language: English
Publisher: CRC Press LLC
Item Height: 1.3 in
Publication Year: 1998
Subject: Materials Science / General, Lasers & Photonics, Physics / Optics & Light, Physics / Crystallography, Civil / General
Type: Textbook
Item Weight: 20.8 Oz
Subject Area: Technology & Engineering, Science
Author: D. K. Bowen, Brian K. Tanner
Item Length: 9.2 in
Item Width: 6.2 in
Format: Hardcover
