Description: The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ray diffraction and the modern techniques available for deployment in research, development, and production. It provides the theoretical and practical background for applying these techniques in scientific and industrial materials characterization. The main aim of the book is to map the theoretical and practical background necessary to the study of single crystal materials by means of high-resolution x-ray diffraction and topography. It combines mathematical formalisms with graphical explanations and hands-on practical advice for interpreting data.
Price: 86.32 USD
Location: Matraville, NSW
End Time: 2024-11-30T23:28:36.000Z
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Item Specifics
Restocking Fee: No
Return shipping will be paid by: Buyer
All returns accepted: Returns Accepted
Item must be returned within: 60 Days
Refund will be given as: Money Back
EAN: 9780367400637
UPC: 9780367400637
ISBN: 9780367400637
MPN: N/A
Book Title: High Resolution X-Ray Diffractometry and Topograph
Item Height: 1.8 cm
Number of Pages: 264 Pages
Language: English
Publication Name: High Resolution X-Ray Diffractometry and Topography
Publisher: CRC Press LLC
Subject: Lasers & Photonics, Materials Science / General, Physics / Optics & Light, Physics / Crystallography, Civil / General
Publication Year: 2019
Item Weight: 17.1 Oz
Type: Textbook
Item Length: 9.8 in
Author: D. Keith Bowen, B. K. Tanner
Subject Area: Technology & Engineering, Science
Item Width: 6.8 in
Format: Trade Paperback
