Description: The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ray diffraction and the modern techniques available for deployment in research, development, and production. It provides the theoretical and practical background for applying these techniques in scientific and industrial materials characterization. The main aim of the book is to map the theoretical and practical background necessary to the study of single crystal materials by means of high-resolution x-ray diffraction and topography. It combines mathematical formalisms with graphical explanations and hands-on practical advice for interpreting data.
Price: 167 USD
Location: Matraville, NSW
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EAN: 9780850667585
UPC: 9780850667585
ISBN: 9780850667585
MPN: N/A
Book Title: High Resolution X-Ray Diffractometry and Topograph
Number of Pages: 264 Pages
Publication Name: High Resolution X-Ray Diffractometry and Topography
Language: English
Publisher: CRC Press LLC
Item Height: 1.3 in
Publication Year: 1998
Subject: Materials Science / General, Lasers & Photonics, Physics / Optics & Light, Physics / Crystallography, Civil / General
Type: Textbook
Item Weight: 20.8 Oz
Subject Area: Technology & Engineering, Science
Author: D. K. Bowen, Brian K. Tanner
Item Length: 9.2 in
Item Width: 6.2 in
Format: Hardcover
